Determine the composition of a wide variety of materials with excellent sensitivity
This technique combines a highly sensitive mass spectrometric detector (percent level to parts per trillion (ppt) range) with an inductively coupled plasma source. ICP-MS can analyze elements from Li to U excepting C, N, O, Cl, Br, I and S, with optimal detection range from 0.1 ppm to 1% wt, and sample size as small as 0.01 g. Sample can be introduced into the ICP-MS as a liquid or as a vaporized solid. Small amounts of sample material can be dissolved in solution or larger samples can be digested for bulk characterization. ICP-MS serves as an excellent semi-quantitative and quantitative instrument; it can also be used to determine the ration of two or more isotopes. A range of interference removal techniques are available to meet your analyses needs. Isotope dilution experiments can also be performed by ICP-MS too, which is often used to certify standard reference materials.
ICP-MS determines trace and ultra-trace amounts of deleterious elements
- Broad applications including inorganic leachable studies
- Capable of analyzing a wide range of samples, including polymer, rock, food, sea water, biological and pharmaceutical samples
- Measure samples containing up to 25% total dissolved solids (TDS)
- Delivers up to 11 orders of magnitude dynamic range from sub-ppt to percent-level concentrations
- Capable of providing >109cps/ppm sensitivity at <2% CeO
- 10,000 separate measurements per second
- Increased sensitivity and improved matrix tolerance
- Polyatomic ion interference removal using hydrogen and helium mode
- Inert sample introduction system for low level Si and precious metal analysis
